IIO: core: Modify scan element type
The current scan element type uses the following format: [be|le]:[s|u]bits/storagebits[>>shift]. To specify multiple elements in this type, added a repeat value. So new format is: [be|le]:[s|u]bits/storagebitsXr[>>shift]. Here r is specifying how may times, real/storage bits are repeating. When X is value is 0 or 1, then repeat value is not used in the format, and it will be same as existing format. Signed-off-by: Srinivas Pandruvada <srinivas.pandruvada@linux.intel.com> Signed-off-by: Jonathan Cameron <jic23@kernel.org>
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