[PATCH] v850: Use __volatile__ qualifier on test_bit asm statements

Otherwise recent versions of gcc seem to optimize away some necessary tests.
Signed-off-by: Miles Bader <miles@gnu.org>
Signed-off-by: Linus Torvalds <torvalds@osdl.org>

include/asm-v850/bitops.h

@@ -129,7 +129,7 @@ extern __inline__ unsigned long ffz (unsigned long word)
 
 #define __const_test_bit(nr, addr)					      \
   ({ int __test_bit_res;						      \
-     __asm__ ("tst1 (%1 - 0x123), %2; setf nz, %0"			\
+     __asm__ __volatile__ ("tst1 (%1 - 0x123), %2; setf nz, %0"		      \
 			   : "=r" (__test_bit_res)			      \
 			   : "g" (((nr) & 0x7) + 0x123),		      \
 			     "m" (*((const char *)(addr) + ((nr) >> 3))));    \
@@ -138,7 +138,7 @@ extern __inline__ unsigned long ffz (unsigned long word)
 extern __inline__ int __test_bit (int nr, const void *addr)
 {
 	int res;
-	__asm__ ("tst1 %1, [%2]; setf nz, %0"
+	__asm__ __volatile__ ("tst1 %1, [%2]; setf nz, %0"
 			      : "=r" (res)
 			      : "r" (nr & 0x7), "r" (addr + (nr >> 3)));
 	return res;