• Uday Shankar's avatar
    nvme: avoid fallback to sequential scan due to transient issues · 811f4de0
    Uday Shankar authored
    Currently, if nvme_scan_ns_list fails, nvme_scan_work will fall back to
    a sequential scan. nvme_scan_ns_list can fail for a variety of reasons,
    e.g. a transient transport issue, and the resulting sequential scan can
    be extremely expensive on controllers reporting an NN value close to the
    maximum allowed (> 4 billion). Avoid sequential scans wherever possible
    by only falling back to them in two cases:
    
    - When the NVMe version supported (VS) value reported by the device is
      older than NVME_VS(1, 1, 0), before which support of Identify NS List
      not required.
    - When the Identify NS List command fails with the DNR bit set in the
      status. This is to accommodate (non-compliant) devices which report a
      VS value which implies support for Identify NS List, but nevertheless
      do not support the command. Such devices will most likely fail the
      command with the DNR bit set.
    
    The third case is when the device claims support for Identify NS List
    but the command fails with DNR not set. In such cases, fallback to
    sequential scan is potentially expensive and likely unnecessary, as a
    retry of the list scan should succeed. So this change skips the fallback
    in this third case.
    Signed-off-by: default avatarUday Shankar <ushankar@purestorage.com>
    Signed-off-by: default avatarChristoph Hellwig <hch@lst.de>
    811f4de0
core.c 141 KB