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Sylwester Nawrocki authored
The V4L2_CID_EXPOSURE_METERING control allows to determine a method used by the camera for measuring the amount of light available for automatic exposure. Signed-off-by:
Sylwester Nawrocki <s.nawrocki@samsung.com> Signed-off-by:
Kyungmin Park <kyungmin.park@samsung.com> Signed-off-by:
Mauro Carvalho Chehab <mchehab@redhat.com>
cf072139
