[TG3]: Fix DMA test failures.

1) Do not reset subcomponents.  GRC reset takes care of it.
2) Improve test by verifying the data on the card too.
3) Do not set DMA_RWCTRL_ASSERT_ALL_BE on chips where the
   meaning of this bit is different.

drivers/net/tg3.c

@@ -7190,26 +7190,33 @@ static int __devinit tg3_do_test_dma(struct tg3 *tp, u32 *buf, dma_addr_t buf_dm
 	test_desc.addr_lo = buf_dma & 0xffffffff;
 	test_desc.nic_mbuf = 0x00002100;
 	test_desc.len = size;
+
+	/*
+	 * HP ZX1 was seeing test failures for 5701 cards running at 33Mhz
+	 * the *second* time the tg3 driver was getting loaded after an
+	 * initial scan.
+	 *
+	 * Broadcom tells me:
+	 *   ...the DMA engine is connected to the GRC block and a DMA
+	 *   reset may affect the GRC block in some unpredictable way...
+	 *   The behavior of resets to individual blocks has not been tested.
+	 *
+	 * Broadcom noted the GRC reset will also reset all sub-components.
+	 */
 	if (to_device) {
 		test_desc.cqid_sqid = (13 << 8) | 2;
-		tw32(RDMAC_MODE, RDMAC_MODE_RESET);
-		tr32(RDMAC_MODE);
-		udelay(40);
 
 		tw32(RDMAC_MODE, RDMAC_MODE_ENABLE);
 		tr32(RDMAC_MODE);
 		udelay(40);
 	} else {
 		test_desc.cqid_sqid = (16 << 8) | 7;
-		tw32(WDMAC_MODE, WDMAC_MODE_RESET);
-		tr32(WDMAC_MODE);
-		udelay(40);
 
 		tw32(WDMAC_MODE, WDMAC_MODE_ENABLE);
 		tr32(WDMAC_MODE);
 		udelay(40);
 	}
-	test_desc.flags = 0x00000004;
+	test_desc.flags = 0x00000005;
 
 	for (i = 0; i < (sizeof(test_desc) / sizeof(u32)); i++) {
 		u32 val;
@@ -7368,9 +7375,19 @@ static int __devinit tg3_test_dma(struct tg3 *tp)
 	    GET_ASIC_REV(tp->pci_chip_rev_id) == ASIC_REV_5701) {
 		/* Remove this if it causes problems for some boards. */
 		tp->dma_rwctrl |= DMA_RWCTRL_USE_MEM_READ_MULT;
-	}
 
-	tp->dma_rwctrl |= DMA_RWCTRL_ASSERT_ALL_BE;
+		/* On 5700/5701 chips, we need to set this bit.
+		 * Otherwise the chip will issue cacheline transactions
+		 * to streamable DMA memory with not all the byte
+		 * enables turned on.  This is an error on several
+		 * RISC PCI controllers, in particular sparc64.
+		 *
+		 * On 5703/5704 chips, this bit has been reassigned
+		 * a different meaning.  In particular, it is used
+		 * on those chips to enable a PCI-X workaround.
+		 */
+		tp->dma_rwctrl |= DMA_RWCTRL_ASSERT_ALL_BE;
+	}
 
 	tw32(TG3PCI_DMA_RW_CTRL, tp->dma_rwctrl);
 
@@ -7385,28 +7402,38 @@ static int __devinit tg3_test_dma(struct tg3 *tp)
 		goto out;
 
 	while (1) {
-		u32 *p, i;
+		u32 *p = buf, i;
 
-		p = buf;
 		for (i = 0; i < TEST_BUFFER_SIZE / sizeof(u32); i++)
 			p[i] = i;
 
 		/* Send the buffer to the chip. */
 		ret = tg3_do_test_dma(tp, buf, buf_dma, TEST_BUFFER_SIZE, 1);
-		if (ret)
+		if (ret) {
+			printk(KERN_ERR "tg3_test_dma() Write the buffer failed %d\n", ret);
 			break;
+		}
 
-		p = buf;
-		for (i = 0; i < TEST_BUFFER_SIZE / sizeof(u32); i++)
+		/* validate data reached card RAM correctly. */
+		for (i = 0; i < TEST_BUFFER_SIZE / sizeof(u32); i++) {
+			u32 val;
+			tg3_read_mem(tp, 0x2100 + (i*4), &val);
+			if (val != p[i]) {
+				printk( KERN_ERR "  tg3_test_dma()  Card buffer currupted on write! (%d != %d)\n", val, i);
+				/* ret = -ENODEV here? */
+			}
 			p[i] = 0;
+		}
 
 		/* Now read it back. */
 		ret = tg3_do_test_dma(tp, buf, buf_dma, TEST_BUFFER_SIZE, 0);
-		if (ret)
+		if (ret) {
+			printk(KERN_ERR "tg3_test_dma() Read the buffer failed %d\n", ret);
+
 			break;
+		}
 
 		/* Verify it. */
-		p = buf;
 		for (i = 0; i < TEST_BUFFER_SIZE / sizeof(u32); i++) {
 			if (p[i] == i)
 				continue;
@@ -7417,6 +7444,7 @@ static int __devinit tg3_test_dma(struct tg3 *tp)
 				tw32(TG3PCI_DMA_RW_CTRL, tp->dma_rwctrl);
 				break;
 			} else {
+				printk(KERN_ERR "tg3_test_dma() buffer corrupted on read back! (%d != %d)\n", p[i], i);
 				ret = -ENODEV;
 				goto out;
 			}