thermal: broadcom: Use thermal_zone_get_crit_temp() in bcm2835_thermal_probe()

Modify the bcm2835 thermal driver to use thermal_zone_get_crit_temp() in
bcm2835_thermal_probe() instead of relying on the assumption that the
critical trip index will always be 0.
Signed-off-by: Rafael J. Wysocki <rafael.j.wysocki@intel.com>
Reviewed-by: Florian Fainelli <florian.fainelli@broadcom.com>
Reviewed-by: Lukasz Luba <lukasz.luba@arm.com>
Link: https://patch.msgid.link/3322893.aeNJFYEL58@rjwysocki.net

drivers/thermal/broadcom/bcm2835_thermal.c

@@ -208,8 +208,7 @@ static int bcm2835_thermal_probe(struct platform_device *pdev)
 	 */
 	val = readl(data->regs + BCM2835_TS_TSENSCTL);
 	if (!(val & BCM2835_TS_TSENSCTL_RSTB)) {
-		struct thermal_trip trip;
-		int offset, slope;
+		int offset, slope, crit_temp;
 
 		slope = thermal_zone_get_slope(tz);
 		offset = thermal_zone_get_offset(tz);
@@ -217,7 +216,7 @@ static int bcm2835_thermal_probe(struct platform_device *pdev)
 		 * For now we deal only with critical, otherwise
 		 * would need to iterate
 		 */
-		err = thermal_zone_get_trip(tz, 0, &trip);
+		err = thermal_zone_get_crit_temp(tz, &crit_temp);
 		if (err < 0) {
 			dev_err(dev, "Not able to read trip_temp: %d\n", err);
 			return err;
@@ -232,7 +231,7 @@ static int bcm2835_thermal_probe(struct platform_device *pdev)
 		val |= (0xFE << BCM2835_TS_TSENSCTL_RSTDELAY_SHIFT);
 
 		/*  trip_adc value from info */
-		val |= bcm2835_thermal_temp2adc(trip.temperature,
+		val |= bcm2835_thermal_temp2adc(crit_temp,
 						offset,
 						slope)
 			<< BCM2835_TS_TSENSCTL_THOLD_SHIFT;