Commit 75f5c434 authored by Deepa Dinamani's avatar Deepa Dinamani Committed by Felipe Balbi

usb: misc: usbtest: Remove timeval usage

timeval is deprecated and not y2038 safe.  Its size also changes according
to 32 bit/ 64 bit compilation.  Replace it with 32 and 64 bit versions of
its individual fields, giving two ioctls with different code values.
The two ioctls are necessary to maintain the 32 bit and 64 bit userspace
compatibility with a 64/32 bit kernel.

Change unsigned to __u32 types for a definitive userspace interface.
This is in accordance with the psABI that the unsigned type is always
32 bits.

Also use motonic timer instead of real time to ensure positive delta
values.

Refactor usbtest_ioctl for readability to isolate the handling of the
testing timing measurement.

The official testusb userspace tool can be changed in a separate patch
to reflect the __u32 changes as well. It can use the usbtest_param_32
struct, since 32 bit seconds is long enough for test durations.
Reviewed-by: default avatarArnd Bergmann <arnd@arndb.de>
Signed-off-by: default avatarDeepa Dinamani <deepa.kernel@gmail.com>
Signed-off-by: default avatarFelipe Balbi <balbi@ti.com>
parent 38660ac7
......@@ -22,18 +22,42 @@ static void complicated_callback(struct urb *urb);
/*-------------------------------------------------------------------------*/
/* FIXME make these public somewhere; usbdevfs.h? */
struct usbtest_param {
/* Parameter for usbtest driver. */
struct usbtest_param_32 {
/* inputs */
unsigned test_num; /* 0..(TEST_CASES-1) */
unsigned iterations;
unsigned length;
unsigned vary;
unsigned sglen;
__u32 test_num; /* 0..(TEST_CASES-1) */
__u32 iterations;
__u32 length;
__u32 vary;
__u32 sglen;
/* outputs */
struct timeval duration;
__s32 duration_sec;
__s32 duration_usec;
};
#define USBTEST_REQUEST _IOWR('U', 100, struct usbtest_param)
/*
* Compat parameter to the usbtest driver.
* This supports older user space binaries compiled with 64 bit compiler.
*/
struct usbtest_param_64 {
/* inputs */
__u32 test_num; /* 0..(TEST_CASES-1) */
__u32 iterations;
__u32 length;
__u32 vary;
__u32 sglen;
/* outputs */
__s64 duration_sec;
__s64 duration_usec;
};
/* IOCTL interface to the driver. */
#define USBTEST_REQUEST_32 _IOWR('U', 100, struct usbtest_param_32)
/* COMPAT IOCTL interface to the driver. */
#define USBTEST_REQUEST_64 _IOWR('U', 100, struct usbtest_param_64)
/*-------------------------------------------------------------------------*/
......@@ -1030,7 +1054,7 @@ struct ctrl_ctx {
unsigned pending;
int status;
struct urb **urb;
struct usbtest_param *param;
struct usbtest_param_32 *param;
int last;
};
......@@ -1155,7 +1179,7 @@ static void ctrl_complete(struct urb *urb)
}
static int
test_ctrl_queue(struct usbtest_dev *dev, struct usbtest_param *param)
test_ctrl_queue(struct usbtest_dev *dev, struct usbtest_param_32 *param)
{
struct usb_device *udev = testdev_to_usbdev(dev);
struct urb **urb;
......@@ -1930,7 +1954,7 @@ static struct urb *iso_alloc_urb(
}
static int
test_queue(struct usbtest_dev *dev, struct usbtest_param *param,
test_queue(struct usbtest_dev *dev, struct usbtest_param_32 *param,
int pipe, struct usb_endpoint_descriptor *desc, unsigned offset)
{
struct transfer_context context;
......@@ -2049,81 +2073,20 @@ static int test_unaligned_bulk(
return retval;
}
/*-------------------------------------------------------------------------*/
/* We only have this one interface to user space, through usbfs.
* User mode code can scan usbfs to find N different devices (maybe on
* different busses) to use when testing, and allocate one thread per
* test. So discovery is simplified, and we have no device naming issues.
*
* Don't use these only as stress/load tests. Use them along with with
* other USB bus activity: plugging, unplugging, mousing, mp3 playback,
* video capture, and so on. Run different tests at different times, in
* different sequences. Nothing here should interact with other devices,
* except indirectly by consuming USB bandwidth and CPU resources for test
* threads and request completion. But the only way to know that for sure
* is to test when HC queues are in use by many devices.
*
* WARNING: Because usbfs grabs udev->dev.sem before calling this ioctl(),
* it locks out usbcore in certain code paths. Notably, if you disconnect
* the device-under-test, hub_wq will wait block forever waiting for the
* ioctl to complete ... so that usb_disconnect() can abort the pending
* urbs and then call usbtest_disconnect(). To abort a test, you're best
* off just killing the userspace task and waiting for it to exit.
*/
/* Run tests. */
static int
usbtest_ioctl(struct usb_interface *intf, unsigned int code, void *buf)
usbtest_do_ioctl(struct usb_interface *intf, struct usbtest_param_32 *param)
{
struct usbtest_dev *dev = usb_get_intfdata(intf);
struct usb_device *udev = testdev_to_usbdev(dev);
struct usbtest_param *param = buf;
int retval = -EOPNOTSUPP;
struct urb *urb;
struct scatterlist *sg;
struct usb_sg_request req;
struct timeval start;
unsigned i;
/* FIXME USBDEVFS_CONNECTINFO doesn't say how fast the device is. */
pattern = mod_pattern;
if (code != USBTEST_REQUEST)
return -EOPNOTSUPP;
int retval = -EOPNOTSUPP;
if (param->iterations <= 0)
return -EINVAL;
if (param->sglen > MAX_SGLEN)
return -EINVAL;
if (mutex_lock_interruptible(&dev->lock))
return -ERESTARTSYS;
/* FIXME: What if a system sleep starts while a test is running? */
/* some devices, like ez-usb default devices, need a non-default
* altsetting to have any active endpoints. some tests change
* altsettings; force a default so most tests don't need to check.
*/
if (dev->info->alt >= 0) {
int res;
if (intf->altsetting->desc.bInterfaceNumber) {
mutex_unlock(&dev->lock);
return -ENODEV;
}
res = set_altsetting(dev, dev->info->alt);
if (res) {
dev_err(&intf->dev,
"set altsetting to %d failed, %d\n",
dev->info->alt, res);
mutex_unlock(&dev->lock);
return res;
}
}
/*
* Just a bunch of test cases that every HCD is expected to handle.
*
......@@ -2133,7 +2096,6 @@ usbtest_ioctl(struct usb_interface *intf, unsigned int code, void *buf)
* FIXME add more tests! cancel requests, verify the data, control
* queueing, concurrent read+write threads, and so on.
*/
do_gettimeofday(&start);
switch (param->test_num) {
case 0:
......@@ -2548,13 +2510,116 @@ usbtest_ioctl(struct usb_interface *intf, unsigned int code, void *buf)
dev->in_pipe, NULL, 0);
break;
}
do_gettimeofday(&param->duration);
param->duration.tv_sec -= start.tv_sec;
param->duration.tv_usec -= start.tv_usec;
if (param->duration.tv_usec < 0) {
param->duration.tv_usec += 1000 * 1000;
param->duration.tv_sec -= 1;
return retval;
}
/*-------------------------------------------------------------------------*/
/* We only have this one interface to user space, through usbfs.
* User mode code can scan usbfs to find N different devices (maybe on
* different busses) to use when testing, and allocate one thread per
* test. So discovery is simplified, and we have no device naming issues.
*
* Don't use these only as stress/load tests. Use them along with with
* other USB bus activity: plugging, unplugging, mousing, mp3 playback,
* video capture, and so on. Run different tests at different times, in
* different sequences. Nothing here should interact with other devices,
* except indirectly by consuming USB bandwidth and CPU resources for test
* threads and request completion. But the only way to know that for sure
* is to test when HC queues are in use by many devices.
*
* WARNING: Because usbfs grabs udev->dev.sem before calling this ioctl(),
* it locks out usbcore in certain code paths. Notably, if you disconnect
* the device-under-test, hub_wq will wait block forever waiting for the
* ioctl to complete ... so that usb_disconnect() can abort the pending
* urbs and then call usbtest_disconnect(). To abort a test, you're best
* off just killing the userspace task and waiting for it to exit.
*/
static int
usbtest_ioctl(struct usb_interface *intf, unsigned int code, void *buf)
{
struct usbtest_dev *dev = usb_get_intfdata(intf);
struct usbtest_param_64 *param_64 = buf;
struct usbtest_param_32 temp;
struct usbtest_param_32 *param_32 = buf;
struct timespec64 start;
struct timespec64 end;
struct timespec64 duration;
int retval = -EOPNOTSUPP;
/* FIXME USBDEVFS_CONNECTINFO doesn't say how fast the device is. */
pattern = mod_pattern;
if (mutex_lock_interruptible(&dev->lock))
return -ERESTARTSYS;
/* FIXME: What if a system sleep starts while a test is running? */
/* some devices, like ez-usb default devices, need a non-default
* altsetting to have any active endpoints. some tests change
* altsettings; force a default so most tests don't need to check.
*/
if (dev->info->alt >= 0) {
if (intf->altsetting->desc.bInterfaceNumber) {
retval = -ENODEV;
goto free_mutex;
}
retval = set_altsetting(dev, dev->info->alt);
if (retval) {
dev_err(&intf->dev,
"set altsetting to %d failed, %d\n",
dev->info->alt, retval);
goto free_mutex;
}
}
switch (code) {
case USBTEST_REQUEST_64:
temp.test_num = param_64->test_num;
temp.iterations = param_64->iterations;
temp.length = param_64->length;
temp.sglen = param_64->sglen;
temp.vary = param_64->vary;
param_32 = &temp;
break;
case USBTEST_REQUEST_32:
break;
default:
retval = -EOPNOTSUPP;
goto free_mutex;
}
ktime_get_ts64(&start);
retval = usbtest_do_ioctl(intf, param_32);
if (retval)
goto free_mutex;
ktime_get_ts64(&end);
duration = timespec64_sub(end, start);
temp.duration_sec = duration.tv_sec;
temp.duration_usec = duration.tv_nsec/NSEC_PER_USEC;
switch (code) {
case USBTEST_REQUEST_32:
param_32->duration_sec = temp.duration_sec;
param_32->duration_usec = temp.duration_usec;
break;
case USBTEST_REQUEST_64:
param_64->duration_sec = temp.duration_sec;
param_64->duration_usec = temp.duration_usec;
break;
}
free_mutex:
mutex_unlock(&dev->lock);
return retval;
}
......
Markdown is supported
0%
or
You are about to add 0 people to the discussion. Proceed with caution.
Finish editing this message first!
Please register or to comment