iio: adc: ad9467: add digital interface test to debugfs
One useful thing to do (in case of problems) in this high speed devices with digital interfaces is to try different test patterns to see if the interface is working properly (and properly calibrated). Hence add this to debugfs. On top of this, for some test patterns, the backend may have a matching validator block which can be helpful in identifying possible issues. For the other patterns some test equipment must be used so one can look into the signal and see how it looks like. Hence, we also add the backend debugfs interface with iio_backend_debugfs_add(). Signed-off-by: Nuno Sa <nuno.sa@analog.com> Link: https://patch.msgid.link/20240802-dev-iio-backend-add-debugfs-v2-8-4cb62852f0d0@analog.comSigned-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
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