- 10 Aug, 2024 7 commits
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Krzysztof Kozlowski authored
All compatibles in this binding without prefixes were deprecated, so adding a new deprecated one after some time is not allowed, because it defies the core logic of deprecating things. Drop the AK09916 vendorless compatible. Fixes: 76e28aa9 ("iio: magnetometer: ak8975: add AK09116 support") Signed-off-by:
Krzysztof Kozlowski <krzysztof.kozlowski@linaro.org> Reviewed-by:
Conor Dooley <conor.dooley@microchip.com> Link: https://patch.msgid.link/20240806053016.6401-2-krzysztof.kozlowski@linaro.orgSigned-off-by:
Jonathan Cameron <Jonathan.Cameron@huawei.com>
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Krzysztof Kozlowski authored
All compatibles in this binding without prefixes were deprecated, so adding a new deprecated one after some time is not allowed, because it defies the core logic of deprecating things. Drop the AK09916 vendorless compatible. Fixes: 76e28aa9 ("iio: magnetometer: ak8975: add AK09116 support") Signed-off-by:
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Nuno Sa authored
Document the debugfs interface for the IIO ad9467 high speed ADC. Signed-off-by:
Nuno Sa <nuno.sa@analog.com> Link: https://patch.msgid.link/20240806-dev-ad-debugfs-doc-v1-2-153b882a3f01@analog.comSigned-off-by:
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Nuno Sa authored
Document the maintainers for the IIO ad9467 high speed ADC. Signed-off-by:
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Nuno Sa authored
Call iio_backend_debugfs_add() to add (if available) the backend debug interface. Signed-off-by:
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Nuno Sa authored
Make it possible to read/write registers on the backend using the debugfs interface for it. Signed-off-by:
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Matteo Martelli authored
Trivial cleanup in __iio_format_value() for the IIO_VAL_FRACTIONAL case where tmp1 = vals[1] assignment is unneeded and irrelevant since tmp1 is immediately overwritten by the subsequent div_s64_rem() call. Signed-off-by:
Matteo Martelli <matteomartelli3@gmail.com> Link: https://patch.msgid.link/20240730-iio-clean-fmt-value-v1-1-3e1c3deafc33@gmail.comSigned-off-by:
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- 03 Aug, 2024 33 commits
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Dumitru Ceclan authored
During setup the st->adc_control is 0, which corresponds to a continuous conversion mode. The reset value for channel 1 is to enable it. The combined effect of these two is that the ADC will start conversions for channel 1 without them being read. This is not neccessarily a problem, but it is an unexpected behavior. Set the ADC state to idle during setup to avoid this. Signed-off-by:
Dumitru Ceclan <dumitru.ceclan@analog.com> Reviewed-by:
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Dumitru Ceclan authored
The ad7124_init_config_vref() function writes the AD7124_ADC_CONTROL register for each channel that is configured to use the internal reference. The ad7124_write_config()function performs 7 SPI transfers for configuring 2 registers: config_x and filter_x. Reduce the number of SPI transfers: -during the probe by only setting the st->adc_control value in ad7124_init_config_vref() and writing to the device only at the end of ad7124_setup(). -in ad7124_write_config() by grouping writes to the same register. Signed-off-by:
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Abhash Jha authored
Add support for configuring and reading the gain and resolution (integration time). Also provide the available values for gain and resoltion respectively via `read_avail` callback. Signed-off-by:
Abhash Jha <abhashkumarjha123@gmail.com> Link: https://patch.msgid.link/20240731063706.25412-2-abhashkumarjha123@gmail.comSigned-off-by:
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Nuno Sa authored
One useful thing to do (in case of problems) in this high speed devices with digital interfaces is to try different test patterns to see if the interface is working properly (and properly calibrated). Hence add this to debugfs. On top of this, for some test patterns, the backend may have a matching validator block which can be helpful in identifying possible issues. For the other patterns some test equipment must be used so one can look into the signal and see how it looks like. Hence, we also add the backend debugfs interface with iio_backend_debugfs_add(). Signed-off-by:
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Nuno Sa authored
Group the backend configurations to be done in preparing and stopping calibration in two new helpers analogous to ad9467_testmode_set(). This is in preparation for adding support for debugFS test_mode where we need similar configurations as in the calibration process. Signed-off-by:
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Nuno Sa authored
Implement debugfs options to read/write registers and print the channel status into a buffer (so we may know better the cause for errors) . Signed-off-by:
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Nuno Sa authored
Add a new axi_adc_read_chan_status() helper so we get the raw register value out of it. This is in preparation of a future change where we really want to look into dedicated bits of the register. Signed-off-by:
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Nuno Sa authored
Add support for configuring the prbs23 sequence. Signed-off-by:
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Nuno Sa authored
Support ADI specific prb23 sequence that can be used both for calibrating or debugging digital interfaces. Signed-off-by:
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Nuno Sa authored
This adds a basic debugfs interface for backends. Two new ops are being added: * debugfs_reg_access: Analogous to the core IIO one but for backend devices. * debugfs_print_chan_status: One useful usecase for this one is for testing test tones in a digital interface and "ask" the backend to dump more details on why a test tone might have errors. Signed-off-by:
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Nuno Sa authored
Instead of only passing the backend ops when calling devm_iio_backend_register(), pass an info like structure that will contains the ops and additional information. Fow now, the backend name is being added as that will be used by the debugFS interface introduced in a later patch. It also opens the door for further customizations passed by backends. All users of devm_iio_backend_register() were updated accordingly. Signed-off-by:
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Rob Herring (Arm) authored
Use of_property_present() to test for property presence rather than of_find_property(). This is part of a larger effort to remove callers of of_find_property() and similar functions. of_find_property() leaks the DT struct property and data pointers which is a problem for dynamically allocated nodes which may be freed. Signed-off-by:
Rob Herring (Arm) <robh@kernel.org> Acked-by:
Andrew Jeffery <andrew@codeconstruct.com.au> Link: https://patch.msgid.link/20240731191312.1710417-5-robh@kernel.orgSigned-off-by:
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Javier Carrasco authored
Drop the manual access to the fwnode of the device to iterate over its child nodes. `device_for_each_child_node` macro provides direct access to the child nodes, and given that they are only required within the loop, the scoped variant of the macro can be used. Use the `device_for_each_child_node_scoped` macro to iterate over the direct child nodes of the device. Signed-off-by:
Javier Carrasco <javier.carrasco.cruz@gmail.com> Reviewed-by:
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Julien Stephan authored
The AD7380 family has some compatible single-ended chips: AD7386/7/8(-4). These single-ended chips have a 2:1 multiplexer in front of each ADC. They also include additional configuration registers that allow for either manual selection or automatic switching (sequencer mode), of the multiplexer inputs. Add a section to describe this. Signed-off-by:
Julien Stephan <jstephan@baylibre.com> Reviewed-by:
David Lechner <dlechner@baylibre.com> Link: https://patch.msgid.link/20240731-ad7380-add-single-ended-chips-v2-7-cd63bf05744c@baylibre.comSigned-off-by:
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Julien Stephan authored
ad7386/7/8(-4) single-ended parts have a 2:1 mux in front of each ADC. >From an IIO point of view, all inputs are exported, i.e ad7386/7/8 export 4 channels and ad7386-4/7-4/8-4 export 8 channels. First inputs of muxes correspond to the first half of IIO channels (i.e 0-1 or 0-3) and second inputs correspond to second half (i.e 2-3 or 4-7) Currently, the driver supports only sampling first half OR second half of the IIO channels. To enable sampling all channels simultaneously, these parts have an internal sequencer that automatically cycles through the mux entries. When enabled, the maximum throughput is divided by two. Moreover, the ADCs need additional settling time, so we add an extra CS toggle to correctly propagate setting, and an additional spi transfer to read the second half. Signed-off-by:
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Julien Stephan authored
Adding ad7386/7/8 (16/14/12 bits) unsigned, dual simultaneous sampling, single-ended compatible parts, and the corresponding ad7386-4/7-4/8-4 4 channels. These parts have a 2:1 multiplexer in front of each ADC. They also include additional configuration registers that allow for either manual selection or automatic switching (sequencer mode), of the multiplexer inputs. This commit focus on integrating manual selection. Sequencer mode will be implemented later. >From an IIO point of view, all inputs are exported, i.e ad7386/7/8 export 4 channels and ad7386-4/7-4/8-4 export 8 channels. Inputs AinX0 of multiplexers correspond to the first half of IIO channels (i.e 0-1 or 0-3) and inputs AinX1 correspond to second half (i.e 2-3 or 4-7). Example for AD7386/7/8 (2 channels parts): IIO | AD7386/7/8 | +---------------------------- | | _____ ______ | | | | | | voltage0 | AinA0 --|--->| | | | | | | mux |----->| ADCA |--- voltage2 | AinA1 --|--->| | | | | | |_____| |_____ | | | _____ ______ | | | | | | voltage1 | AinB0 --|--->| | | | | | | mux |----->| ADCB |--- voltage3 | AinB1 --|--->| | | | | | |_____| |______| | | | +---------------------------- When switching channel, the ADC require an additional settling time. According to the datasheet, data is valid on the third CS low. We already have an extra toggle before each read (either direct reads or buffered reads) to sample correct data, so we just add a single CS toggle at the end of the register write. Signed-off-by: -
Julien Stephan authored
ad738x family contains single-ended parts that have a 2:1 mux in front of ADC, so the number of IIO channels is different from the number of simultaneous channels that can be sampled. To prepare the support for single-ended parts, introduce a new num_simultaneous_channels variable. For currently supported parts, num_simultaneous_channels is equal to num_channels minus 1 (the timestamps channel) Signed-off-by:
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Julien Stephan authored
Add missing trailing commas in iio_scan_type structures Signed-off-by:
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Julien Stephan authored
Add a function to retrieve the index of the active scan mask inside the available scan masks array. As in iio_scan_mask_match and iio_sanity_check_avail_scan_masks, this function does not handle multi-long masks correctly. It only checks the first long to be zero, and will use such mask as a terminator even if there was bits set after the first long. This should be fine since the available_scan_mask has already been sanity tested using iio_sanity_check_avail_scan_masks. See iio_scan_mask_match and iio_sanity_check_avail_scan_masks for more details Signed-off-by:
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Julien Stephan authored
Adding ad7386/7/8 single-ended compatible parts, and the corresponding ad7386-4/7-4/8-4 4 channels. Acked-by:
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Marcelo Schmitt authored
Reviewed-by:
Marcelo Schmitt <marcelo.schmitt@analog.com> Reviewed-by:
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Marcelo Schmitt authored
Add support for AD4000 series of low noise, low power, high speed, successive approximation register (SAR) ADCs. Reviewed-by:
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Jonathan Cameron authored
spi: Support MOSI idle configuration Add support for configuring the idle state of the MOSI signal in controllers.
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Antoniu Miclaus authored
Add separate handling for adf4378 within the driver. The main difference between adf4377 and adf4378 is that adf4378 has only one output which is handled by only one gpio. Signed-off-by:
Antoniu Miclaus <antoniu.miclaus@analog.com> Link: https://patch.msgid.link/20240729095047.25040-3-antoniu.miclaus@analog.comSigned-off-by:
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Antoniu Miclaus authored
The adf4378 provides only one output channel. Therefore there is only one gpio available to enable the output. Reflect that into the bindings using property conditions. Add product link for the adf4378. Signed-off-by:
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Kaustabh Chakraborty authored
STK3013 is a proximity sensor by Sensortek, bearing chipid of 0x31. Despite being marketed as a proximity sensor, it also appears to have ambient light sensing capabilities. The part is fully compatible with the existing implementation of the device driver. Add the compatible string of stk3013 to the existing list, with a fallback of stk3310. Signed-off-by:
Kaustabh Chakraborty <kauschluss@disroot.org> Acked-by:
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Kaustabh Chakraborty authored
Add support for Sensortek's STK3013 in the driver. The part bears the product ID 0x31. As seen in [1], Sensortek lists STK3013 as a proximity sensor. But it has been experimentally observed that they do have ambient light sensing capabilities. Furthermore, [2] implements a proximity and ambient light sensor driver for STK3x1x devices, which is also indicative of the fact that these parts are also ambient light sensors. [1] https://www.sensortek.com.tw/index.php/en/products/optical-sensor/ [2] https://android.googlesource.com/kernel/msm.git/+/e6dfa4641d88201e8019be19ff557e5d2cf4572fSigned-off-by:
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Kaustabh Chakraborty authored
In order to allow newer devices which are compatible with existing sensors, issuing a warning for an unknown chipid indicates that something has gone wrong with the init process, which isn't ideal. Swap it with a friendlier info message to get things right. Suggested-by:
Conor Dooley <conor@kernel.org> Signed-off-by:
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David Lechner authored
Use devm_regulator_get_enable_read_voltage() to replace tsc2046_adc_configure_regulator() which does the same thing. Signed-off-by:
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Petar Stoykov authored
Add myself as a maintainer for Sensirion SDP500 pressure sensor driver Signed-off-by:
Petar Stoykov <pd.pstoykov@gmail.com> Link: https://patch.msgid.link/20240725-mainline_sdp500-v4-3-ea2f5b189958@gmail.comSigned-off-by:
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Petar Stoykov authored
Sensirion SDP500 is a digital differential pressure sensor. The sensor is accessed over I2C. Signed-off-by:
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Petar Stoykov authored
Sensirion SDP500 is a digital differential pressure sensor. It provides a digital I2C output. Add devicetree bindings requiring the compatible string and I2C slave address (reg). Signed-off-by:
Krzysztof Kozlowski <krzk@kernel.org> Link: https://patch.msgid.link/20240725-mainline_sdp500-v4-1-ea2f5b189958@gmail.comSigned-off-by:
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Matteo Martelli authored
Add support for Microchip PAC1921 Power/Current monitor. Implemented features: * capture of bus voltage, sense voltage, current and power measurements in free-run integration mode * support for both raw and triggered buffer reading * support for overflow events * scale attributes to control voltage and current gains * oversampling ratio attribute to control the number of integration samples * sampling rate attribute that reflects the integration period * userspace attribute and DT parameter to control shunt resistor * simple power management support Limitations: * operation mode fixed to free-run integration * READ/INT pin and OUT pin not supported * no controls for measurement resolutions and filters Signed-off-by:
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